Lambda Advanced Technology

 

  Subscribe to our Mailing List

Name:
Email:
Subscribe Unsubscribe
  
  News about new product launches
  Opinions from industry experts

 

           Products  UV VIS Spectrophotometers  U-4150

 

 


UV-Visible/NIR Spectrophotometer U4150
 

 

The U4150 is a research grade UV Vis NIR spectrophotometer for the measurement of solids and liquids in transmission and reflection modes.
The system comes with an integrating sphere as standard and features traditional double beam technology, variable band pass and patented detector change software.
A wide range of measurement accessories is also available

 

   
 
  Small signal level differences at detector switching afford highly accurate measurements even when the wavelength of detector is being switched.
 

Multiple detectors are installed in the integrating sphere to perform measurement over a wide range of wavelengths, from ultraviolet to visible to near infrared regions. The changes in photometric values at detector switching (from signal level differences) are minimized due to a design utilizing Hitachi’s expertise in integrating sphere construction, signal processing technologies, etc.

Example of Measured Data around the Wavelength of Detector Switching (Absorption spectrum of Gold Nanorods)

 
    Low stray light and low polarization characteristics are attained with Hitachi’s high-performance prism-grating double monochromator system.
 
The UH4150 adopts a prism-grating (P-G) double monochromator optical system, continuing the established reputation of the U-4100 optical system. Large changes in light intensity of the S and P polarization are less likely for the prism-grating (P-G) system than for the generally used grating-grating (G-G) system. The UH4150 offers low noise measurements, even for low transmittance and reflectance samples.
 
    Collimated light beam allows accurate measurement of reflected light and scattered light.
  The incident angle is important for the measurement of specular reflectance of solid samples. For focused light beam, the incident angle varies depending on the lens’s focal length, etc. Consequently, the values of simulation of design of optical thin films, such as dielectric multilayer film and prism, would differ from actual measured values. In the case of a collimated light beam, however, the incident angle is always the same with respect to the sample, leading to a highly accurate measurement of specular reflectance. Moreover, the collimated light beam is useful for the evaluation of diffusivity (haze) and the measurement of transmittance of lenses.

Specular Reflectance measurement example

   
    A wide variety of detectors affords the selection of detectors suitable for measurement objectives.
  Eight types of integrating spheres of different materials, sizes, and shapes are available

Lineup of Detectors

   
    New ergonomic design has been adopted.
 


The door of sample compartment is modified to improve the operation. An ergonomic design is adopted by taking into account the operation of replacing samples and accessories.

   
    Compatible with many of the U-4100 accessories.
 
Common accessories are available for both models. Accessories used with Model U-4100 can also be used with Model U4150. Since the accessories are removable, they help to accommodate a wider range of measurement types.
   
    Higher throughput than Model U-4100.
 
While maintaining the high-performing optical system of the model U-4100, the UH4150 provides higher throughput measurements. In the previous model, a scan speed of 600 mm/min was necessary for a measurement using a data interval of 1 nm. With Model UH4150, you can measure at 1 nm intervals while using a scan speed of 1,200 nm/min, reducing the measurement time significantly.*5 The UH4150 measures from 240 to 2,600 nm in approximately two minutes. It is effective for samples requiring measurement in UV-VIS-NIR wavelength range, such as Solar Reflective Materials.
   
 

Reflectance Spectrum of Solar Reflective Material using Scan Speed of 600 nm/min

Reflectance Spectrum of Solar Reflective material using Scan Speed of 1,200 nm/min

 


 
U-4150 Brochure
 
    TEL: 020 8429 7512          FAX: 020 8429 7539          EMAIL: sales@lambda-at.com
 
UV VIS
Fluorescence
ICP
Mercury Analysers
TOC
Microwave Digestion
 
 

Hitachi

Hitachi

Teledyne Leeman Labs

Teledyne Leeman Labs

Teledyne Tekmar

Berghof

 
  U5100
U5300
U2900/2910
U3900
U3900H
U4150
DropScan


F2700
F2710
F7100
Prodigy 7
Prodigy Plus
Prodigy Glove Box
Prodigy Mobile

QuickTrace® M-7600
QuickTrace® M-8000
Hydra IIC

Lotix
Torch
Fusion
Speedwave Entry
Speedwave Expert
 
Solid Sample Analysis
Prodigy DC Arc

 

 
Pressure Digestion
Reaction Vessels
Elemental Analysis
Drop Technology
Water Determination
   
 

Berghof

Berghof

TSHR

--

Berghof

   
  DAB BR TX 1800
TX 6000
TS 6000
TN 6000
TX 7000
TS 7000
TN 7000
HR 7000
FU 3


TLDAµV®
TLDAC50®
TLDAOcean®
EasyH2O®
    Cells